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CompTIA Security+ Exam 2025 SY0-701 Question # 215 Topic 22 Discussion

CompTIA Security+ Exam 2025 SY0-701 Question # 215 Topic 22 Discussion

SY0-701 Exam Topic 22 Question 215 Discussion:
Question #: 215
Topic #: 22

Which of the following aspects of the data management life cycle is most directly impacted by local and international regulations?


A.

Destruction


B.

Certification


C.

Retention


D.

Sanitization


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