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BCS ISTQB Certified Tester Advanced Level - Test Management v3.0 TM3 Question # 13 Topic 2 Discussion

BCS ISTQB Certified Tester Advanced Level - Test Management v3.0 TM3 Question # 13 Topic 2 Discussion

TM3 Exam Topic 2 Question 13 Discussion:
Question #: 13
Topic #: 2

During a test process improvement initiative, defect information is gathered to perform defect cluster analysis.

Which aspect is most likely being targeted for improvement?


A.

To improve the defect removal efficiency.


B.

To reduce the total number of defects.


C.

To better understand risk and focus testing, as part of risk-based testing.


D.

To minimise the costs associated with defects.


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