iSQI ISTQB® Certified Tester Advanced Level - Test Manager [Syllabus 2012] CTAL-TM_Syll2012 Question # 27 Topic 3 Discussion

iSQI ISTQB® Certified Tester Advanced Level - Test Manager [Syllabus 2012] CTAL-TM_Syll2012 Question # 27 Topic 3 Discussion

CTAL-TM_Syll2012 Exam Topic 3 Question 27 Discussion:
Question #: 27
Topic #: 3

Defect Management

Which of the following information would you expect to be the most useful to perform a defect clustering analysis?

Number of correct responses: 1

K21 credit


A.

The trend in the lag time from defect reporting to resolution


B.

The defect component information


C.

The lifecycle phase in which the defect has been introduced


D.

The defect removal efficiency information


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