SAP Certified Associate - SAP S/4HANA Cloud Private Edition, Extended Warehouse Management C_S4EWM_2023 Question # 17 Topic 2 Discussion
C_S4EWM_2023 Exam Topic 2 Question 17 Discussion:
Question #: 17
Topic #: 2
For quality inspections in decentralized SAP EWM with QM integration, you need a quality inspection rule and the inspection setup in the material master. How can you simplify the master data creation?
A.
Use acceptance sampling or pre-sampling from production
B.
Create the inspection setup in the material master and distribute it to create the quality inspection rule
C.
Use the inspection object type 7
D.
Create the quality inspection rule and distribute it to create the inspection setup in the material master
Simplifying master data for QM in decentralized EWM involves leveraging ERP data. Option B ("Create the inspection setup in the material master and distribute it to create the quality inspection rule") is correct because the inspection setup in the ERP material master (QM view) can be distributed to EWM via CIF or qRFC, automatically generating the inspection rule, configured in SPRO: SCM Extended Warehouse Management > Quality Management > Integration. Options A, C, and D don’t streamline this process effectively.
[Reference: SAP S/4HANA Cloud, Private Edition, EWM Quality Management Guide - "QM Integration"; SAP Help Portal - "Master Data in EWM QM.", , ]
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